Metrology Applications Engineer

Who We Are

Applied Materials is a global leader in materials engineering solutions used to produce virtually every new chip and advanced display in the world. We design, build and service cutting-edge equipment that helps our customers manufacture display and semiconductor chips – the brains of devices we use every day. As the foundation of the global electronics industry, Applied enables the exciting technologies that literally connect our world – like AI and IoT. If you want to push the boundaries of materials science and engineering to create next generation technology, join us to deliver material innovation that changes the world. 

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Job Overview

We are seeking an experienced Metrology Application Engineer to support advanced semiconductor metrology operations, with a focus on thin film thickness and material characterization.

The role will be responsible for tool setup, recipe development, cross-tool matching, and SPC control for state-of-the-art metrology platforms such as:

• Rigaku XRF/XRR, Primus system
• KLA optical thickness system (SS10K/ASET family)
• KLA optical defect inspection system (SP3/SP7)

This position plays a critical role in enabling high-precision metrology capability, process control, and tool-to-tool matching in a fast paced R&D lab environment.

Key Responsibilities

1. Metrology Tool Ownership & Application Development

• Own and support thin film metrology tools (XRF/XRR, optical thickness, defect inspection).
• Develop, qualify, and release measurement recipes for various material stacks (Cu, dielectric, metal films, etc.).
• Ensure measurement accuracy, repeatability, and robustness across process flows.

2. Tool Matching & Correlation

• Establish and maintain tool-to-tool matching across identical and dissimilar platforms.
• Perform cross-site / cross-tool correlation
• Support cross site/lab matching activities to ensure consistent measurement output across tools.

3. Recipe Development & Optimization

• Develop and optimize recipes for:
  • Measurement accuracy (thickness, density, composition)
  • Throughput and stability
  • Signal quality and noise reduction
• Work closely with process and integration teams to support new film/material introduction and process changes.
• Support DOE and characterization plan for new films and stacks.

4. SPC & Process Control

• Define and implement SPC strategies for metrology:
  • Control chart setup
  • Baseline and control limit tuning
• Monitor metrology performance and drive continuous improvement initiatives.
• Identify and resolve measurement drifts, excursions, and tool-induced variability.

Cross-functional Collaboration

• Work closely with:
  • Process engineering
  • Equipment engineering
  • External partners
• Support training and knowledge transfer for technicians and engineers.

Qualifications & Requirements

Education

• Bachelor’s degree in:
• Materials Engineering
• Physics/Chemistry
• Electrical Engineering or Semiconductor-related discipline

Experience

• 3–5+ years of experience in semiconductor metrology / process engineering
• Hands-on experience with:
• XRF / XRR (Rigaku or equivalent)
• Optical thickness tools (KLA SS10K / ASET etc)
• Tool matching and correlation
• Recipe development and optimization
• SPC implementation and monitoring

Technical Skills

• Strong understanding of:
• Thin film physics (density, roughness, composition)
• Measurement principles (X-ray, reflectometry, optical)
• Familiar with DOE and data analysis
• Ability to troubleshoot measurement discrepancies and tool drift issue.

Soft Skills

• Strong analytical and problem-solving skills
• Fast leaner & ability to work in a fast-paced R&D lab environment

Additional Information

Time Type:

Employee Type:

Travel:

Relocation Eligible:

Applied Materials is an Equal Opportunity Employer. Qualified applicants will receive consideration for employment without regard to race, color, national origin, citizenship, ancestry, religion, creed, sex, sexual orientation, gender identity, age, disability, veteran or military status, or any other basis prohibited by law.